Skip to content
VuFind
  • 0 Items in e-Shelf (Full)
  • History
  • User Account
  • Logout
  • User Account
  • Help
    • English
    • Deutsch
  • Books & more
  • Articles & more
  • JuSER
Advanced
 
  • Literature Request
  • Cite this
  • Email this
  • Export
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
    • Export to MARC
    • Export to MARCXML
    • Export to BibTeX
  • Favorites
  • Add to e-Shelf Remove from e-Shelf
Cover Image

Advances in optical and electron microscopy. 9.

Saved in:
Personal Name(s): Barer, R., editor
Imprint: London : Academic Pr., 1984.
Physical Description: XIII, 370 S.
Note: englisch
ISBN: 9780120299096
0120299097
Series Title: Advances in optical and electron microscopy ; 9.
Keywords: electronic image recording in conventional electron microscopy
electron energy loss spectroscopy (EELS) in the electron microscope
practical problems in high resolution electron microscopy (HREM)
binocular image shearing optical microscopes
laser microanalysis
instruments for optical microscope image analysis
Subject (ZB):
optical microscopy
electron microscopy
Classification:
FHEC - Optical microscopy in materials characterization
FHG - Electron microscopy
FHE - Imaging methods in materials characterization
Shelf Classification:
FHE - Bildgebende Verfahren in der Materialcharakterisierung
  • Holdings
  • Staff View

ZB
Reading Room Call Number: FHE 001-09 Barcode: 1085004492 Available   

  • Forschungszentrum Jülich
  • Central Library (ZB)
  • Powered by VuFind 6.1.1
Loading...