Scanning electron microscopy : physics of image formation and microanalysis.

Scanning electron microscopy: physics of image formation and microanalysis :

Saved in:
Reimer, L.
Berlin : Springer, 1985.
XVIII, 457 S.
englisch
9780387135304
9783540135302
0387135308
3540135308
Springer series in optical sciences ; 45.

ZB
Open Stacks Call Number: S 003454-0045'01' Barcode: 1086000618 Available