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Scanning electron microscopy : physics of image formation and microanalysis.

Scanning electron microscopy: physics of image formation and microanalysis :

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Personal Name(s): Reimer, L.
Imprint: Berlin : Springer, 1985.
Physical Description: XVIII, 457 S.
Note: englisch
ISBN: 9780387135304
9783540135302
0387135308
3540135308
Series Title: Springer series in optical sciences ; 45.
Subject (ZB):
scanning electron microscopy
Classification:
FHJ - Scanning electron microscopy, analytical electron microscopy
FHJC - Microbeam analysis
FHEM - Image analysis in microscopy, stereology
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Open Stacks Call Number: S 003454-0045'01' Barcode: 1086000618 Available   

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