Scanning electron microscopy : physics of image formation and microanalysis.
Scanning electron microscopy: physics of image formation and microanalysis :
Saved in:
| Personal Name(s): | Reimer, L. |
|---|---|
| Imprint: |
Berlin :
Springer,
1985.
|
| Physical Description: |
XVIII, 457 S. |
| Note: |
englisch |
| ISBN: |
9780387135304 9783540135302 0387135308 3540135308 |
| Series Title: |
Springer series in optical sciences ;
45. |
| Subject (ZB): | |
| Classification: |
| LEADER | 01546cam a2200373 n 4500 | ||
|---|---|---|---|
| 001 | 113434 | ||
| 005 | 20080611144000.0 | ||
| 008 | r1985 | ||
| 020 | |a 3540135308 | ||
| 020 | |a 0387135308 | ||
| 035 | |a (Sirsi) a101473 | ||
| 084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
| 084 | 0 | |a FHEM - Image analysis in microscopy, stereology |2 ZB | |
| 084 | 0 | |a FHJC - Microbeam analysis |2 ZB | |
| 245 | 0 | 0 | |a Scanning electron microscopy : |b physics of image formation and microanalysis. |
| 260 | |a Berlin : |b Springer, |c 1985. | ||
| 300 | |a XVIII, 457 S. | ||
| 490 | 0 | |a Springer series in optical sciences ; |v 45. | |
| 500 | |a englisch | ||
| 520 | |a Scanning electron microscopy: physics of image formation and microanalysis : | ||
| 520 | |a electron optics of a scanning electron microscope | ||
| 520 | |a electron scattering and diffusion | ||
| 520 | |a emission of electrons and x-ray quanta | ||
| 520 | |a detectors and signal processing | ||
| 520 | |a imaging with secondary and backscattered electrons | ||
| 520 | |a electron beam induced current, cathodoluminescence and special techniques | ||
| 520 | |a crystal structure analysis by diffraction | ||
| 520 | |a elemental analysis and imaging with x-rays | ||
| 596 | |a 1 | ||
| 650 | 4 | |a scanning electron microscopy | |
| 700 | 1 | |a Reimer, L. | |
| 900 | |a S 003454-0045'01' | ||
| 908 | |a Monographie, Sammelwerk | ||
| 949 | |a S 003454-0045'01' |w LC |c 1 |i 1086000618 |d 3/12/2012 |e 20/11/2012 |l STACKS |m ZB |n 12 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT | ||