. ACM Sigmetrics Conference on Measurement and Modeling of Computer Systems : proceedings of the conference. 1987: Banff, 11.05.1987-14.05.1987. New-York, NY: Association for Computing Machinery.
Chicago Style CitationACM Sigmetrics Conference On Measurement and Modeling of Computer Systems : Proceedings of the Conference. 1987: Banff, 11.05.1987-14.05.1987. New-York, NY: Association for Computing Machinery.
MLA CitationACM Sigmetrics Conference On Measurement and Modeling of Computer Systems : Proceedings of the Conference. 1987: Banff, 11.05.1987-14.05.1987. New-York, NY: Association for Computing Machinery.
Warning: These citations may not always be 100% accurate.