VLSI testing.
Saved in:
Personal Name(s): | Williams, T. W., editor |
---|---|
Imprint: |
Amsterdam :
North Holland,
1986.
|
Physical Description: |
IX, 275 S. |
Note: |
englisch |
ISBN: |
0444878904 9780444878953 0444878955 9780444878908 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
Advances in CAD for VLSI ;
vol 0005. |
Keywords: |
VLSI : function test |
Classification: |
LEADER | 00712cam a2200241 n 4500 | ||
---|---|---|---|
001 | 114215 | ||
005 | 20010308091100.0 | ||
008 | r1986 | ||
020 | |a 0444878955 | ||
020 | |a 0444878904 | ||
035 | |a (Sirsi) a102026 | ||
084 | 0 | |a TBL - VLSI |2 ZB | |
245 | 0 | 0 | |a VLSI testing. |
260 | |a Amsterdam : |b North Holland, |c 1986. | ||
300 | |a IX, 275 S. | ||
490 | 0 | |a Advances in CAD for VLSI ; |v vol 0005. | |
500 | |a englisch | ||
596 | |a 1 | ||
653 | |a VLSI : function test | ||
700 | 1 | |a Williams, T. W., |e Hrsg. | |
900 | |a B 059608'01'-005 | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a B 059608'01'-005 |w LC |c 1 |i 1086003591 |d 8/3/2001 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-T |1 PRINT |