Instabilities in silicon devices: silicon passivation and related instabilities. vol 0001.

Saved in:
Barbottin, G., (editor)
Amsterdam : North Holland, 1986.
XXIV, 517 S.
englisch
9780444879448
0444879447
Instabilities in silicon devices ; vol 0001.
semiconductor interface : silicon : silicon oxide
semiconductor passivation : si
silicon oxide film
LEADER 01016nam a2200277 n 4500
001 115293
005 19970916000000.0
008 r1986
020 |a 0444879447 
035 |a (Sirsi) a102814 
084 0 |a FFPE - Thin film electronic properties, semiconductor interfaces  |2 ZB 
084 1 |a FFP - Physik dünner Filme  |2 LS 
245 0 0 |a Instabilities in silicon devices: silicon passivation and related instabilities. vol 0001. 
260 |a Amsterdam :   |b North Holland,   |c 1986. 
300 |a XXIV, 517 S. 
490 0 |a Instabilities in silicon devices ;   |v vol 0001. 
500 |a englisch 
596 |a 1 
653 |a semiconductor interface : silicon : silicon oxide 
653 |a semiconductor passivation : si 
653 |a silicon oxide film 
700 1 |a Barbottin, G.,   |e Hrsg. 
900 |a B 060218'01'-001 
900 |a FFP 053-01 
908 |a Monographie, Sammelwerk 
949 |a FFP 053-01  |w LC  |c 1  |i 1086004696  |d 7/9/2004  |e 6/8/2004  |l STACKS  |m ZB  |n 2  |r Y  |s Y  |t ZBB  |u 25/3/2009  |x ZB-F  |1 PRINT