Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends / A. Benninghoven, F. G. Rüdenauer, H. W. Werner
Saved in:
| Personal Name(s): | Benninghoven, Alfred, author |
|---|---|
| Rüdenauer, Friedrich G., author / Werner, H. W., author | |
| Imprint: |
New-York, NY :
Wiley,
1987
|
| Physical Description: |
XXXV, 1227 Seiten |
| Note: |
englisch |
| ISBN: |
0471010561 9780471010562 |
| Series Title: |
Chemical analysis ;
86 |
| Subject (ZB): | |
| Classification: | |
| Shelf Classification: |
| LEADER | 01725cam a2200385 n 4500 | ||
|---|---|---|---|
| 001 | 117056 | ||
| 008 | r1987 eng | ||
| 020 | |a 0471010561 | ||
| 035 | |a (Sirsi) a104258 | ||
| 035 | |a (Sirsi) i9780471010562 | ||
| 041 | |a eng | ||
| 084 | 0 | |a FGGJ - Ion beam analysis, ion beam solid interaction | |
| 084 | 1 | |a FGG - Ionenstrahltechnologie | |
| 100 | |a Benninghoven, Alfred, |e Verfasser | ||
| 245 | 0 | 0 | |a Secondary ion mass spectrometry : |b basic concepts, instrumental aspects, applications and trends / |c A. Benninghoven, F. G. Rüdenauer, H. W. Werner |
| 264 | |a New-York, NY : |b Wiley, |c 1987 | ||
| 300 | |a XXXV, 1227 Seiten | ||
| 336 | |a Text |b txt |2 rdacontent | ||
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| 490 | 0 | |a Chemical analysis ; |v 86 | |
| 500 | |a englisch | ||
| 650 | 4 | |a SIMS (secondary ion mass spectroscopy) | |
| 700 | |a Rüdenauer, Friedrich G., |e Verfasser | ||
| 700 | |a Werner, H. W., |e Verfasser | ||
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| 908 | |a Monographie, Sammelwerk | ||
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