Convergent-beam electron diffraction . 2
Saved in:
Personal Name(s): | Tanaka, M., author |
---|---|
Terauchi, M., author / Kaneyama, T., author | |
Imprint: |
Tokyo :
JEOL,
1988
|
Physical Description: |
IV, 284 Seiten |
Note: |
englisch |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
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Convergent beam electron diffraction ;
2 |
Classification: | |
Shelf Classification: |
LEADER | 01031nam a2200313 n 4500 | ||
---|---|---|---|
001 | 118993 | ||
005 | 19970518000000.0 | ||
008 | r1988 | ||
035 | |a (Sirsi) a105874 | ||
041 | |a eng | ||
084 | 0 | |a FHGE - Electron diffraction | |
084 | 1 | |a FHG - Elektronenmikroskopie | |
100 | 1 | |a Tanaka, M., |e Verfasser | |
245 | 0 | 0 | |a Convergent-beam electron diffraction . |n 2 |
260 | |a Tokyo : |b JEOL, |c 1988 | ||
300 | |a IV, 284 Seiten | ||
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
490 | 0 | |a Convergent beam electron diffraction ; |v 2 | |
500 | |a englisch | ||
596 | |a 1 | ||
700 | 1 | |a Terauchi, M., |e Verfasser | |
700 | 1 | |a Kaneyama, T., |e Verfasser | |
900 | |a B 065372'01'-002 | ||
900 | |a FHG 035-02 | ||
908 | |a Formeln, Tabellen, Karten | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a FHG 035-02 |w LC |c 1 |i 1089104896 |d 17/8/2001 |e 9/8/2001 |l STACKS |m ZB |n 1 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |