Metal semiconductor contacts and devices.
Saved in:
| Personal Name(s): | Cohen, S. S. |
|---|---|
| Gildenblat, G. S. | |
| Imprint: |
Orlando, FL :
Academic Pr.,
1986.
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| Physical Description: |
X, 424 S. |
| Note: |
englisch |
| ISBN: |
0122341139 9780122341137 |
| Series Title: |
VLSI electronics microstructure science ;
13. |
| Keywords: |
electrical characteristics of metal semiconductor interface experimental methods of barrier height determination test structures for ohmic contact characterization metal semiconductor contact fabrication procedures practical ohmic contacts to silicon ohmic contacts to III-V semiconductors, polysilicon emitter contacts metal semiconductor devices: Schottky barrier MOS transistors, Schottky diodes, field effect transistors table: selected properties of commonly used metals |
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Reading Room  Call Number: FGM 019-13 Barcode: 1088105937
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