Electron microscopy in solid state physics.

Electron microscopy in materials science and solid state physics: fundamentals, techniques, imaging, applications, preparation techniques

Personal Name(s):	Bethge, Heinz, (editor)
Imprint:	Amsterdam : Elsevier, 1987.
Physical Description:	596 S.
Note:	Aus d. Dt. übers. Deutsche Übersetzung unter B 054140*01* Sammlung von 21 Review-Artikeln englisch
ISBN:	9780444989673 0444989676
Series Title:	Materials science monographs ; 40.
Keywords:	fundamentals and techniques of electron microscopy conventional electron microscopy: fundamentals of electron optics and instrumentation conventional electron microscopy: image formation electron diffraction: fundamentals and application HREM HVEM scanning electron microscopy (SEM) imaging in electron microscopy indirect imaging of surfaces by replica and decoration techniques direct imaging of surfaces: emission electron microscopy, reflection electron microscopy, mirror electron microscopy analytical electron microscopy: combined imaging, diffraction and spectroscopical methods image processing in electron microscopy lattice defect imaging by diffraction contrast application of electron microscopy in materials science fundamental processes of plastic deformation microprocesses of fracture fractography, failure analysis with scanning electron microscopy applications of electron microscopy in solid state physics morphology of polymers defects in semiconductors and devices molecular processes in crystal growth growth and structure of thin films dislocation arrangements in grain boundaries and interphase boundaries domain structure of ferromagnetic and ferroelectric solids theory of diffraction contrast in the electron microscope for lattice defect imaging and its computer simulation survey of preparation techniques in transmission electron microscopy
Classification:	FHJ - Scanning electron microscopy, analytical electron microscopy FHG - Electron microscopy
Shelf Classification:	FHG - Elektronenmikroskopie