Scanning electron microscopy 1986,3 : An international journal of scanning electron microscopy, related techniques, and applications.

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AMF-O'Hare, IL : Scanning Electron Microscopy, 1987.
X, S. 793-1241, XI-XIII.
englisch
Scanning electron microscopy ; 1986,3.

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Open Stacks Call Number: S 003531-1986,3'01' Barcode: 1088101234 Available