Scanning electron microscopy 1986,2 : An international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
Personal Name(s): | Becker, R. P., editor |
---|---|
Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1987.
|
Physical Description: |
X, S. 329-792, XI-XV. |
Note: |
englisch |
Series Title: |
Scanning electron microscopy ;
1986,2. |
Classification: |
LEADER | 00826nam a2200205 n 4500 | ||
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005 | 19970518000000.0 | ||
008 | r1987 | ||
035 | |a (Sirsi) a108745 | ||
084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
245 | 0 | 0 | |a Scanning electron microscopy 1986,2 : |b An international journal of scanning electron microscopy, related techniques, and applications. |
260 | |a AMF-O'Hare, IL : |b Scanning Electron Microscopy, |c 1987. | ||
300 | |a X, S. 329-792, XI-XV. | ||
490 | 0 | |a Scanning electron microscopy ; |v 1986,2. | |
500 | |a englisch | ||
596 | |a 1 | ||
700 | 1 | |a Becker, R. P., |e Hrsg. | |
900 | |a S 003531-1986,2'01' | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a S 003531-1986,2'01' |w LC |c 1 |i 1088101233 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |