Scanning electron microscopy 1986,1 : An international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
Personal Name(s): | Becker, R. P., editor |
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Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1987.
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Physical Description: |
VIII, 328 S., IX-XI. |
Note: |
englisch |
Series Title: |
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Scanning electron microscopy ;
1986,1. |
Classification: |
ZB | |
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Open Stacks Call number: S 003531-1986,1'01' Barcode: 1088101232 Available |