Scanning electron microscopy 1986,1 : An international journal of scanning electron microscopy, related techniques, and applications.

Saved in:
Becker, R. P., (editor)
AMF-O'Hare, IL : Scanning Electron Microscopy, 1987.
VIII, 328 S., IX-XI.
englisch
Scanning electron microscopy ; 1986,1.

ZB
Open Stacks Call Number: S 003531-1986,1'01' Barcode: 1088101232 Available