APA Citation

Heyman, J. S. (1987). Electronics reliability and measurement technology: conference: proceedings: Hampton, VA, 03.06.86-05.06.86. Washington, DC: NASA.

Chicago Style Citation

Heyman, J. S. Electronics Reliability and Measurement Technology: Conference: Proceedings: Hampton, VA, 03.06.86-05.06.86. Washington, DC: NASA, 1987.

MLA Citation

Heyman, J. S. Electronics Reliability and Measurement Technology: Conference: Proceedings: Hampton, VA, 03.06.86-05.06.86. Washington, DC: NASA, 1987.

Warning: These citations may not always be 100% accurate.