Electronics reliability and measurement technology: conference: proceedings : Hampton, VA, 03.06.86-05.06.86.
Saved in:
| Personal Name(s): | Heyman, J. S., (editor) |
|---|---|
| Imprint: |
Washington, DC :
NASA,
1987.
|
| Physical Description: |
IX, 139 S. |
| Note: |
englisch |
| Series Title: |
NASA conference publication ;
vol 2472. |
| Classification: |
| LEADER | 00886nam a2200241 n 4500 | ||
|---|---|---|---|
| 001 | 122808 | ||
| 005 | 19970518000000.0 | ||
| 008 | r1987 | ||
| 035 | |a (Sirsi) a109276 | ||
| 084 | 0 | |a FGMH - Metallization, physics of microelectronics |2 ZB | |
| 245 | 0 | 0 | |a Electronics reliability and measurement technology: conference: proceedings : |b Hampton, VA, 03.06.86-05.06.86. |
| 260 | |a Washington, DC : |b NASA, |c 1987. | ||
| 300 | |a IX, 139 S. | ||
| 490 | 0 | |a NASA conference publication ; |v vol 2472. | |
| 500 | |a englisch | ||
| 596 | |a 1 | ||
| 700 | 1 | |a Heyman, J. S., |e Hrsg. | |
| 710 | 2 | |a United States. |b National Aeronautics and Space Administration. | |
| 710 | 2 | |a Langley Research Center (Hampton, Va.) | |
| 901 | |a N87-27204 | ||
| 901 | |a L-16315 | ||
| 908 | |a Konferenz | ||
| 949 | |a N87-27204 |w LC |c 1 |i 6133201652 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |2 KONFERENZ | ||