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Cover Image

Analytical techniques for thin films.

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Personal Name(s): Tu, K. N., editor
Imprint: Boston, MA : Academic Pr., 1988.
Physical Description: XI, 493 S.
Note: englisch
ISBN: 9780123418272
0123418275
Series Title: Treatise on materials science and technology ; 27.
Keywords: submicron structure and microanalysis
synchrotron radiation photoemission studies of interfaces
ESCA (XPS)
modern developments in soft X-ray imaging
X-ray diffraction analysis of strains and stresses in thin films
X-ray diffraction analysis of diffusion in thin films
cross sectional transmission electron microscopy of electronic and photonic devices
high resolution transmission electron microscopy of surfaces and interfaces
scanning transmission electron microscopy
Rutherford backscattering spectroscopy (RBS) on thin solid films
atomic structure and atomic layer compositional analysis of thin solid films using the time of flight atom probe field ion microscopy (APFIM)
Classification:
FHAB - Surface and thin film characterization
Shelf Classification:
FHA - Materialcharakterisierung
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Reading Room Call Number: FHA 021 Barcode: 1088103971 Available   
Open Stacks Call Number: S 002070-0027'01' Barcode: 1088103509 Available   

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