Interface migration and control of microstructure: international symposium : ASM's metal congress : TMS/AIME fall meeting : Detroit, MI, 17.09.84-21.09.84.
Interface migration and control of microstructure :
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| Personal Name(s): | Pande, C. S., (editor) |
|---|---|
| Imprint: |
Metals-Park, OH :
American Society for Metals,
1986.
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| Physical Description: |
VIII, 204 S. |
| Note: |
englisch |
| ISBN: |
0871702606 9780871702609 |
| Classification: | |
| Shelf Classification: |