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Cover Image

Interface migration and control of microstructure: international symposium : ASM's metal congress : TMS/AIME fall meeting : Detroit, MI, 17.09.84-21.09.84.

Interface migration and control of microstructure :

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Personal Name(s): Pande, C. S., editor
Imprint: Metals-Park, OH : American Society for Metals, 1986.
Physical Description: VIII, 204 S.
Note: englisch
ISBN: 0871702606
9780871702609
Classification:
FMHF - Grain boundaries, polycrystals
Shelf Classification:
FMH - Thermomechanische Behandlung, Ausscheidungen, Rekristallisation, Textur
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ZB
Reading Room Call Number: FMH 079 Barcode: 1088105340 Available   

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