Aspects of charged particle optics / Peter W. Hawkes Hrsg.
Saved in:
| Personal Name(s): | Hawkes, Peter W., editor |
|---|---|
| Imprint: |
Boston, Mass. :
Academic Pr.,
1989
|
| Physical Description: |
XII, 324 S. |
| Note: |
englisch |
| ISBN: |
9780120146734 0120146738 |
| Series Title: |
Advances in electronics and electron physics ;
73 |
| Keywords: |
proton : microprobe electron microscope : history electron beam : testing |
| Subject (ZB): | |
| Classification: | |
| Shelf Classification: |
| LEADER | 00969cam a2200301 n 4500 | ||
|---|---|---|---|
| 001 | 127510 | ||
| 005 | 19971217000000.0 | ||
| 008 | r1989 eng | ||
| 020 | |a 0120146738 | ||
| 035 | |a (Sirsi) a113339 | ||
| 041 | |a eng | ||
| 084 | 0 | |a PED - Particle radiation, particle optics | |
| 084 | 1 | |a PED - Teilchenstrahlung, Teilchenoptik | |
| 245 | 0 | 0 | |a Aspects of charged particle optics / |c Peter W. Hawkes Hrsg. |
| 260 | |a Boston, Mass. : |b Academic Pr., |c 1989 | ||
| 300 | |a XII, 324 S. | ||
| 490 | 0 | |a Advances in electronics and electron physics ; |v 73 | |
| 500 | |a englisch | ||
| 596 | |a 1 | ||
| 650 | 4 | |a ion optics | |
| 653 | |a proton : microprobe | ||
| 653 | |a electron microscope : history | ||
| 653 | |a electron beam : testing | ||
| 700 | 1 | |a Hawkes, Peter W., |e Hrsg. | |
| 900 | |a S 000100-0073'01' | ||
| 900 | |a PED 001 | ||
| 908 | |a Monographie, Sammelwerk | ||
| 949 | |a PED 001 |w LC |c 1 |i 1089102424 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-P |1 PRINT | ||