Atom probe field ion microscopy and its applications / T. Sakurai, A. Sakai, H. W. Pickering
Atom probe field ion microscopy (apfim) :
Saved in:
Personal Name(s): | Sakurai, T. |
---|---|
Sakai, A. / Pickering, H. W. | |
Imprint: |
Boston :
Academic Pr.,
1989
|
Physical Description: |
VII, 299 S. |
Note: |
englisch |
ISBN: |
9780120145829 0120145820 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
Advances in electronics and electron physics. Supplement ;
20 |
Classification: | |
Shelf Classification: |
LEADER | 01345nam a2200373 n 4500 | ||
---|---|---|---|
001 | 127808 | ||
005 | 19970519000000.0 | ||
008 | r1989 eng | ||
020 | |a 0120145820 | ||
035 | |a (Sirsi) a113608 | ||
041 | |a eng | ||
084 | 0 | |a FHEH - Ion microscopy | |
084 | 1 | |a FHE - Bildgebende Verfahren in der Materialcharakterisierung | |
245 | 0 | 0 | |a Atom probe field ion microscopy and its applications / |c T. Sakurai, A. Sakai, H. W. Pickering |
260 | |a Boston : |b Academic Pr., |c 1989 | ||
300 | |a VII, 299 S. | ||
490 | 0 | |a Advances in electronics and electron physics. Supplement ; |v 20 | |
500 | |a englisch | ||
520 | |a Atom probe field ion microscopy (apfim) : | ||
520 | |a theory | ||
520 | |a instrumentation | ||
520 | |a applications in surface science (field absorption, surface segregation, gas surface reactions) | ||
520 | |a applications in semiconductor physics | ||
520 | |a applications in metallurgy | ||
520 | |a study of macromolecules | ||
520 | |a scanning tunneling microscopy | ||
596 | |a 1 | ||
700 | 1 | |a Sakurai, T. | |
700 | 1 | |a Sakai, A. | |
700 | 1 | |a Pickering, H. W. | |
900 | |a S 000100-SUPPL.0020'01' | ||
900 | |a FHE 026 | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a FHE 026 |w LC |c 1 |i 1089103837 |d 14/6/2010 |e 26/5/2010 |l STACKS |m ZB |n 1 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |