Secondary ion mass spectroscopy : principles and applications.
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| Personal Name(s): | Vickerman, John C., editor |
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| Imprint: |
Oxford :
Clarendon Pr.,
1989.
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| Physical Description: |
XII, 341 S. |
| Note: |
englisch |
| ISBN: |
9780198556251 019855625X |
| Series Title: |
International series of monographs on chemistry ;
17. |
| Keywords: |
the SIMS phenomenon - the experimental parameters SIMS - the theoretical models SIMS instrumentation SIMS depth profiling of semiconductors the application of static SIMS in surface science static SIMS for applied surface analysis SIMS imaging SIMS- related techniques standard static SIMS spectra |
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| IBN-1-2 | |
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