Annual review of materials science. 19.
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| Personal Name(s): | Huggins, R. A., editor |
|---|---|
| Imprint: |
Palo-Alto, CA :
Annual Reviews,
1989.
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| Physical Description: |
IX, 562 S. |
| Note: |
englisch |
| ISBN: |
9780824317195 082431719X |
| Series Title: |
Annual review of materials science ;
19. |
| Keywords: |
dynamical diffraction imaging (topography) with X-ray synchrotron radiation use of laser techniques to study the dynamics of molecular surface interaction toward unified computer models for predicting fracture of solids fractal phenomena in disordered systems gas source molecular beam epitaxy photo- electrochemical methods for III-V compound semiconductor device processing ion beam processing for surface modification rapid omnidirectional compaction (ROC) of powder chemically induced interface migration in solids materials synthesis by mechanical alloying polymer interdiffusion structural relaxation in metastable strained layer semiconductors fluoride glasses very low thermal expansion materials composite electrolytes hard metals and cermets structural properties of ionomers crystal chemistry and properties of mixed valence copper oxides synthesis, stabilization and electronic structure of quantum semiconductor nanocrystals |
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Reading Room  Call Number: FAF 003-19 Barcode: 1089104750
Available
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