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Annual review of materials science. 19.

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Personal Name(s): Huggins, R. A., editor
Imprint: Palo-Alto, CA : Annual Reviews, 1989.
Physical Description: IX, 562 S.
Note: englisch
ISBN: 9780824317195
082431719X
Series Title: Annual review of materials science ; 19.
Keywords: dynamical diffraction imaging (topography) with X-ray synchrotron radiation
use of laser techniques to study the dynamics of molecular surface interaction
toward unified computer models for predicting fracture of solids
fractal phenomena in disordered systems
gas source molecular beam epitaxy
photo- electrochemical methods for III-V compound semiconductor device processing
ion beam processing for surface modification
rapid omnidirectional compaction (ROC) of powder
chemically induced interface migration in solids
materials synthesis by mechanical alloying
polymer interdiffusion
structural relaxation in metastable strained layer semiconductors
fluoride glasses
very low thermal expansion materials
composite electrolytes
hard metals and cermets
structural properties of ionomers
crystal chemistry and properties of mixed valence copper oxides
synthesis, stabilization and electronic structure of quantum semiconductor nanocrystals
Subject (ZB):
mechanical alloying
Classification:
FAF - Materials research - comprehensive works
Shelf Classification:
FAF - Materialforschung - allgemeine Serien
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