Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
Saved in:
| Personal Name(s): | Briggs, D., editor |
|---|---|
| Edition: |
2nd ed. |
| Imprint: |
Chichester :
Wiley,
1990
|
| Physical Description: |
XI, 657 S. |
| Note: |
englisch |
| ISBN: |
3793555496 379413317X 0471950407 (paper) 9783794133178 9783793555490 0471920819 (cloth) |
| Series Title: |
Practical surface analysis ;
1 |
| Keywords: |
a perspective on the analysis of surfaces and interfaces instrumentation in PES and AES spectral interpretation in AES and PES depth profiling in AES and PES quantification of AES and PES applications of AES in microelectronics AES in metallurgy applications of electron spectroscopy to heterogeneous catalysis applications of XPS in polymer technology use of AES and PES in corrosion science spectrometer energy scale calibration in AES and PES charge referencing techniques in AES and PES for insulators data analysis in XPS and AES Auger chemical shifts and the Auger parameter photoelectron and Auger energies and the Auger parameter (tables) |
| Subject (ZB): | |
| Classification: | |
| Shelf Classification: |
| LEADER | 02552cam a2200565 n 4500 | ||
|---|---|---|---|
| 001 | 129986 | ||
| 005 | 19980513000000.0 | ||
| 008 | r1990 | ||
| 020 | |a 0471920819 (cloth) | ||
| 020 | |a 0471950407 (paper) | ||
| 020 | |a 3793555496 | ||
| 020 | |a 379413317X | ||
| 035 | |a (Sirsi) a115548 | ||
| 084 | 0 | |a FHAB - Surface and thin film characterization | |
| 084 | 0 | |a FFGC - Electron spectroscopy | |
| 084 | 1 | |a FHA - Materialcharakterisierung | |
| 245 | 0 | 0 | |a Practical surface analysis . |n 1 . |p Auger and x-ray photoelectron spectroscopy |
| 250 | |a 2nd ed. | ||
| 260 | |a Chichester : |b Wiley, |c 1990 | ||
| 300 | |a XI, 657 S. | ||
| 490 | 0 | |a Practical surface analysis ; |v 1 | |
| 500 | |a englisch | ||
| 596 | |a 1 10 11 89 115 | ||
| 650 | 4 | |a surface analysis | |
| 650 | 4 | |a photoelectron spectroscopy | |
| 650 | 4 | |a Auger electron spectroscopy | |
| 653 | |a a perspective on the analysis of surfaces and interfaces | ||
| 653 | |a instrumentation in PES and AES | ||
| 653 | |a spectral interpretation in AES and PES | ||
| 653 | |a depth profiling in AES and PES | ||
| 653 | |a quantification of AES and PES | ||
| 653 | |a applications of AES in microelectronics | ||
| 653 | |a AES in metallurgy | ||
| 653 | |a applications of electron spectroscopy to heterogeneous catalysis | ||
| 653 | |a applications of XPS in polymer technology | ||
| 653 | |a use of AES and PES in corrosion science | ||
| 653 | |a spectrometer energy scale calibration in AES and PES | ||
| 653 | |a charge referencing techniques in AES and PES for insulators | ||
| 653 | |a data analysis in XPS and AES | ||
| 653 | |a Auger chemical shifts and the Auger parameter | ||
| 653 | |a photoelectron and Auger energies and the Auger parameter (tables) | ||
| 700 | 1 | |a Briggs, D., |e Hrsg. | |
| 900 | |a FHA 029-01 | ||
| 900 | |a B 056141'02'-001 | ||
| 908 | |a Monographie, Sammelwerk | ||
| 949 | |a B 056141'02'-001 |w LC |c 1 |i 1090105133 |d 12/12/2002 |l STACKS |m IBN-1-2 |r Y |s Y |t INSTB |u 25/3/2009 |x INST-F |1 PRINT | ||
| 949 | |a B 056141'02'-001 |w LC |c 1 |i 1091104031 |d 16/2/2010 |e 20/10/2009 |l STACKS |m IBN-3-4 |n 1 |r Y |s Y |t INSTB |u 25/3/2009 |x INST-F |1 PRINT | ||
| 949 | |a FHA 029-01 |w LC |c 1 |i 1098101291 |d 30/8/2018 |e 27/8/2018 |l STACKS |m ZB |n 51 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT | ||
| 949 | |a B 056141'02'-001 |w LC |c 1 |i 1096100964 |d 31/8/2022 |e 31/8/2022 |k CHECKEDOUT |l STACKS |m ZEA-3 |n 2 |r M |s Y |t INSTB |u 25/3/2009 |x INST-F |1 PRINT | ||
| 949 | |a B 056141'02'-001 |w LC |c 1 |i 1213101322 |l STACKS |m IEK-4 |p €251.74 |r Y |s Y |t INSTB |u 22/10/2013 |x INST-F |z KM_13 |1 PRINT |o .STAFF. 0 |o .KO-STELLE. 21400 | ||