Characterization of materials. 1.
Saved in:
Personal Name(s): | Lifshin, E,, editor |
---|---|
Imprint: |
Weinheim :
VCH Verl. Ges.,
1992.
|
Physical Description: |
724 S. |
Note: |
englisch |
ISBN: |
3527268154 9780895736901 089573690X 9783527268153 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
Materials science and technology ;
2A. |
Keywords: |
electron diffraction and transmission electron microscopy analytical electron microscopy scanning electron microscopy x-ray diffraction light optical microscopy atomic spectrometry thermoanalytical methods application of synchrotron x-radation to problems in materials science x-ray fluorescence analysis polymer molecular structure determination |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
---|---|
Reading Room Call number: FAF 001-02A Barcode: 1092102694 Available |