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Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.

Saved in:
Siegel, Benjamin M.
Beaman, Donald Robert.
New York : Wiley, 1975.
xiii, 474 p.
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973
"A Wiley biomedical-health publication."
englisch
9780471790204
0471790206
electron microscopy : resolution : application
conference united states : electron microscopy
electron microprobe analysis
FHJ - Scanning electron microscopy, analytical electron microscopy
FHG - Electron microscopy
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084 0 |a FHJ - Scanning electron microscopy, analytical electron microscopy  |2 ZB 
245 0 0 |a Physical aspects of electron microscopy and microbeam analysis /   |c edited by Benjamin M. Siegel and D. R. Beaman. 
260 |a New York :   |b Wiley,   |c 1975. 
300 |a xiii, 474 p. 
500 |a Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973 
500 |a "A Wiley biomedical-health publication." 
500 |a englisch 
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650 4 |a electron microprobe analysis 
653 |a electron microscopy : resolution : application 
653 |a conference united states : electron microscopy 
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700 1 |a Beaman, Donald Robert. 
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710 2 |a Microbeam Analysis Society. 
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