Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
Saved in:
Personal Name(s): | Siegel, Benjamin M. |
---|---|
Beaman, Donald Robert. | |
Imprint: |
New York :
Wiley,
1975.
|
Physical Description: |
xiii, 474 p. |
Note: |
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973 "A Wiley biomedical-health publication." englisch |
ISBN: |
9780471790204 0471790206 |
Keywords: |
electron microscopy : resolution : application conference united states : electron microscopy |
Subject (ZB): | |
Classification: |
LEADER | 01333nam a2200313 n 4500 | ||
---|---|---|---|
001 | 1962 | ||
005 | 19970313000000.0 | ||
008 | r1975 | ||
020 | |a 0471790206 | ||
035 | |a (Sirsi) a12173 | ||
084 | 0 | |a FHG - Electron microscopy |2 ZB | |
084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
245 | 0 | 0 | |a Physical aspects of electron microscopy and microbeam analysis / |c edited by Benjamin M. Siegel and D. R. Beaman. |
260 | |a New York : |b Wiley, |c 1975. | ||
300 | |a xiii, 474 p. | ||
500 | |a Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973 | ||
500 | |a "A Wiley biomedical-health publication." | ||
500 | |a englisch | ||
596 | |a 1 | ||
650 | 4 | |a electron microprobe analysis | |
653 | |a electron microscopy : resolution : application | ||
653 | |a conference united states : electron microscopy | ||
700 | 1 | |a Siegel, Benjamin M. | |
700 | 1 | |a Beaman, Donald Robert. | |
710 | 2 | |a Electron Microscopy Society of America. | |
710 | 2 | |a Microbeam Analysis Society. | |
900 | |a B 041241'01' | ||
908 | |a Konferenz | ||
949 | |a B 041241'01' |w LC |c 1 |i 1075004555 |d 28/4/1997 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |2 KONFERENZ |