The Rietveld method / ed. by R. A. Young

Personal Name(s):	Young, R. A., editor
Imprint:	Oxford : Oxford University Pr., 1993
Physical Description:	X, 298 S.
Note:	englisch
ISBN:	0198555776 9780198555773
Series Title:	Oxford science publications International Union of Crystallography book series International Union of Crystallography monographs on crystallography ; 5
Keywords:	introduction to the Rietveld method mathematical aspects of Rietveld refinement flow of radiation in a polycrystalline material data collection strategies in Rietveld analysis: fitting the experiment to the need background modeling in Rietveld analysis analytical profile fitting of x-ray powder diffraction profiles in Rietveld analysis crystal imperfection broadening and peak shape in the Rietveld method Bragg reflection profile shape in x-ray powder diffraction patterns restraints and constraints in Rietveld refinement Rietveld refinement with time of flight powder diffraction data from pulsed neutron sources combined x-ray and neutron Rietveld refinement Rietveld analysis programs RIETAN and PREMOS and special applications position constrained and unconstrained powder- pattern- decomposition methods ab initio structure solution with powder diffraction data
Subject (ZB):	powder diffraction X-ray powder diffraction crystal structure analysis
Classification:	FCAB - X-ray crystallography, X-ray diffraction FCAD - Crystal structure analysis
Shelf Classification:	FCA - Kristallographie, Röntgenbeugung