The Rietveld method / ed. by R. A. Young
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Personal Name(s): | Young, R. A., editor |
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Imprint: |
Oxford :
Oxford University Pr.,
1993
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Physical Description: |
X, 298 S. |
Note: |
englisch |
ISBN: |
0198555776 9780198555773 |
Series Title: |
Oxford science publications
International Union of Crystallography book series International Union of Crystallography monographs on crystallography ; 5 |
Keywords: |
introduction to the Rietveld method mathematical aspects of Rietveld refinement flow of radiation in a polycrystalline material data collection strategies in Rietveld analysis: fitting the experiment to the need background modeling in Rietveld analysis analytical profile fitting of x-ray powder diffraction profiles in Rietveld analysis crystal imperfection broadening and peak shape in the Rietveld method Bragg reflection profile shape in x-ray powder diffraction patterns restraints and constraints in Rietveld refinement Rietveld refinement with time of flight powder diffraction data from pulsed neutron sources combined x-ray and neutron Rietveld refinement Rietveld analysis programs RIETAN and PREMOS and special applications position constrained and unconstrained powder- pattern- decomposition methods ab initio structure solution with powder diffraction data |
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ZB | |
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