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The Rietveld method / ed. by R. A. Young

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Personal Name(s): Young, R. A., editor
Imprint: Oxford : Oxford University Pr., 1993
Physical Description: X, 298 S.
Note: englisch
ISBN: 0198555776
9780198555773
Series Title: Oxford science publications
International Union of Crystallography book series
International Union of Crystallography monographs on crystallography ; 5
Keywords: introduction to the Rietveld method
mathematical aspects of Rietveld refinement
flow of radiation in a polycrystalline material
data collection strategies in Rietveld analysis: fitting the experiment to the need
background modeling in Rietveld analysis
analytical profile fitting of x-ray powder diffraction profiles in Rietveld analysis
crystal imperfection broadening and peak shape in the Rietveld method
Bragg reflection profile shape in x-ray powder diffraction patterns
restraints and constraints in Rietveld refinement
Rietveld refinement with time of flight powder diffraction data from pulsed neutron sources
combined x-ray and neutron Rietveld refinement
Rietveld analysis programs RIETAN and PREMOS and special applications
position constrained and unconstrained powder- pattern- decomposition methods
ab initio structure solution with powder diffraction data
Subject (ZB):
powder diffraction
X-ray powder diffraction
crystal structure analysis
Classification:
FCAB - X-ray crystallography, X-ray diffraction
FCAD - Crystal structure analysis
Shelf Classification:
FCA - Kristallographie, Röntgenbeugung
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