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Cover Image

Investigations of surfaces and interfaces vol B.

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Personal Name(s): Rossiter, Bryant W., editor
Edition: 2. ed.
Imprint: New-York, NY : Wiley, 1993.
Physical Description: XI, 745 S.
Note: englisch
ISBN: 0471544051
9780471544050
Series Title: Physical methods of chemistry ; 9B.
Keywords: surface crystallography by low energy electron diffraction (LEED)
analysis of surfaces by Auger electron spectroscopy and related techniques
analysis of surfaces by X-ray photoelectron spectroscopy
low energy ion scattering and Rutherford backscattering spectroscopies
X-ray absorption spectroscopy (surface extended and near edge X-ray absorption fine structure) at surfaces
monolayer assemblies
(formation, phase equilibria, energy transfer and optical, electrical and electrooptical effects)
applications of spectroscopic techniques to the in situ study of electrochemical interfaces
surface enhanced Raman scattering (SERS)
Subject (ZB):
surface analysis
Classification:
FHAB - Surface and thin film characterization
Shelf Classification:
FHA - Materialcharakterisierung
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Reading Room Call Number: FHA 033B Barcode: 1093102216 Available   

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