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Cover Image

Properties of strained and relaxed silicon germanium.

Saved in:
Personal Name(s): Kasper, E., editor
Imprint: London : Institution of Electrical Engineers, 1995.
Physical Description: XIV, 232 S.
Note: englisch
ISBN: 0852968264
9780852968260
Series Title: EMIS datareviews series ; 12.
Keywords: strained layer systems
strained and relaxed SiGe alloys
Subject (ZB):
silicon
germanium
strain
relaxation
structure
thermal properties
mechanical properties
lattice dynamics
vibration
band structure
surface properties
Classification:
FAAB - Solid state physics - reference books
FJKB - Elemental semiconductors
Shelf Classification:
SHE - Festkörperphysikalische Daten - Tabellenwerke
  • Holdings
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LEADER 01282cam a2200409 n 4500
001 142351
005 20000727113800.0
008 r1995
020 |a 0852968264 
035 |a (Sirsi) a126500 
084 0 |a FAAB - Solid state physics - reference books  |2 ZB 
084 0 |a FJKB - Elemental semiconductors  |2 ZB 
084 1 |a SHE - Festkörperphysikalische Daten - Tabellenwerke  |2 LS 
245 0 0 |a Properties of strained and relaxed silicon germanium. 
260 |a London :   |b Institution of Electrical Engineers,   |c 1995. 
300 |a XIV, 232 S. 
490 0 |a EMIS datareviews series ;   |v 12. 
500 |a englisch 
596 |a 1 
650 4 |a silicon 
650 4 |a germanium 
650 4 |a strain 
650 4 |a relaxation 
650 4 |a structure 
650 4 |a thermal properties 
650 4 |a mechanical properties 
650 4 |a lattice dynamics 
650 4 |a vibration 
650 4 |a band structure 
650 4 |a surface properties 
653 |a strained layer systems 
653 |a strained and relaxed SiGe alloys 
700 1 |a Kasper, E.,   |e Hrsg. 
900 |a S 001975-0012'01' 
900 |a SHE 015-12 
908 |a Handbuch 
949 |a SHE 015-12  |w LC  |c 1  |i 1096104288  |d 29/8/1997  |l REFERENCE  |m ZB  |r Y  |s Y  |t PR  |u 25/3/2009  |x ZB-F  |1 PRINT  |2 HB 

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