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Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse / Peter Fritz Schmidt ; L. J. Balk ; R. Blaschke ; W. Bröcker ; E. Demm [und 9 andere]

scanning electron microscopy and microanalysis

Saved in:
Personal Name(s): Schmidt, Peter Fritz, author
Balk, L. J., author / Blaschke, R., author / Bröcker, W., author / Demm, E., author
Imprint: Renningen : Expert Verlag, 1994
Physical Description: 810 Seiten
Note: deutsch
ISBN: 3816910386
9783816910381
Series Title: Kontakt und Studium ; 444
Subject (ZB):
scanning electron microscopy
microanalysis
field emission microscopy
X-ray microanalysis
electron beam analysis
cathodoluminescence
Classification:
CTYR - Microanalysis
FHJ - Scanning electron microscopy, analytical electron microscopy
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084 0 |a FHJ - Scanning electron microscopy, analytical electron microscopy 
084 0 |a CTYR - Microanalysis 
100 1 |a Schmidt, Peter Fritz,   |e  Verfasser 
245 0 0 |a Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse /  |c  Peter Fritz Schmidt ; L. J. Balk ; R. Blaschke ; W. Bröcker ; E. Demm [und 9 andere] 
264 |a Renningen :  |b  Expert Verlag,   |c  1994 
300 |a 810 Seiten 
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490 0 |a Kontakt und Studium ;  |v  444 
500 |a deutsch 
520 |a scanning electron microscopy and microanalysis 
596 |a 1 11 
650 4 |a scanning electron microscopy 
650 4 |a microanalysis 
650 4 |a field emission microscopy 
650 4 |a X-ray microanalysis 
650 4 |a electron beam analysis 
650 4 |a cathodoluminescence 
700 |a Balk, L. J.,   |e  Verfasser 
700 |a Blaschke, R.,   |e  Verfasser 
700 |a Bröcker, W.,   |e  Verfasser 
700 |a Demm, E.,   |e  Verfasser 
900 |a S 002702-0444'01' 
908 |a Monographie, Sammelwerk 
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949 |a S 002702-0444'01'  |w LC  |c 1  |i 1095101664  |d 8/5/2020  |e 4/5/2020  |l STACKS  |m ZB  |n 9  |r Y  |s Y  |t ZBB  |u 27/8/2018  |x ZB-F  |z UNKNOWN  |1 PRINT  |o .STAFF. 0 

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