Skip to content
VuFind
  • 0 Items in e-Shelf (Full)
  • History
  • User Account
  • Logout
  • User Account
  • Help
    • English
    • Deutsch
  • Books & more
  • Articles & more
  • JuSER
Advanced
 
  • Literature Request
  • Cite this
  • Email this
  • Export
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
    • Export to MARC
    • Export to MARCXML
    • Export to BibTeX
  • Favorites
  • Add to e-Shelf Remove from e-Shelf
Cover Image

Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse / Peter Fritz Schmidt ; L. J. Balk ; R. Blaschke ; W. Bröcker ; E. Demm [und 9 andere]

scanning electron microscopy and microanalysis

Saved in:
Personal Name(s): Schmidt, Peter Fritz, author
Balk, L. J., author / Blaschke, R., author / Bröcker, W., author / Demm, E., author
Imprint: Renningen : Expert Verlag, 1994
Physical Description: 810 Seiten
Note: deutsch
ISBN: 3816910386
9783816910381
Series Title: Kontakt und Studium ; 444
Subject (ZB):
scanning electron microscopy
microanalysis
field emission microscopy
X-ray microanalysis
electron beam analysis
cathodoluminescence
Classification:
CTYR - Microanalysis
FHJ - Scanning electron microscopy, analytical electron microscopy
  • Holdings
  • Staff View

IBN-3-4
Institute Call Number: S 002702-0444'01' Barcode: 1095103611 Available   
ZB
Open Stacks Call Number: S 002702-0444'01' Barcode: 1095101664 Available   

  • Forschungszentrum Jülich
  • Central Library (ZB)
  • Powered by VuFind 6.1.1
Loading...