Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen / Hrsg. Otto Brümmer ...

Personal Name(s):	Brümmer, Otto, editor
Imprint:	Braunschweig, Wiesbaden : Vieweg, 1980.
Physical Description:	432 S.
Note:	deutsch
ISBN:	3528083980 9783528083984
Keywords:	x-ray diffraction x-ray topography x-ray fluorescence analysis electron microprobe analysis high resolution x-ray spectroscopy solid state analysis by ion induced x-ray emission high energy electron diffraction (HEED) low energy electron diffraction (LEED) transmission electron microscopy (TEM) scanning electron miroscopy field emission microscopy electron energy loss spectroscopy (EELS) Auger electron spectroscopy (AES) photoelectron spectroscopy (PES) ion induced electron emission ion scattering spectroscopy (ISS) ionometry (channeling, Rutherford backscattering) secondary ion mass spectroscopy (SIMS) electron stimulated ion desorption
Subject (ZB):	electron diffraction
Classification:	FHAB - Surface and thin film characterization FHGE - Electron diffraction FGGJ - Ion beam analysis, ion beam solid interaction FHEE - X-ray microscopy, surface topography FHA - Materials characterization - general aspects
Shelf Classification:	FHA - Materialcharakterisierung