Advances in imaging and electron physics. 110 / ed. by Peter W. Hawkes
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Personal Name(s): | Hawkes, Peter W., editor |
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Imprint: |
San Diego, Calif. :
Academic Press,
1999
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Physical Description: |
XIV, 178 S. |
Note: |
englisch |
ISBN: |
9780120147519 0120147511 |
Series Title: |
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Advances in imaging and electron physics ;
110 |
Keywords: |
interference scanning optical probe microscopy high speed electron microscopy soft mathematical morphology: extensions, algorithms and implementations |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FHE 039-110 Barcode: 1099102623 Available |