Analytical techniques for material characterization : proceedings of the international workshop, Baton Rouge, USA, 11-16 May 1987 / editors, W.E. Collins, B.V.R. Chowdari, S. Radhakrishna ; Committee on Science & Technology in Developing Countries.
Saved in:
| Personal Name(s): | Collins, W. E. |
|---|---|
| Chowdari, B. V. R. / Radhakrishna, S. | |
| Imprint: |
Singapore, Teaneck, NJ :
World Scientific Pub. Co.,
1987.
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| Physical Description: |
xiii, 407 p. |
| Note: |
"International Workshop on Analytical Techniques for Material Characterization."--T.p. verso englisch |
| ISBN: |
9971505126 (pbk.) 9971505118 9789971505110 |
| Series Title: |
WSPC COSTED series in emerging technology.
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| Keywords: |
spectroscopy : inorganic compound : alloy : stainless steel surface science probe techniques and their application to materials characterization characterization of fast ion conductors characterization of materials for telecommunication application of rutherford backscattering characterization of nuclear materials charge densities: comparison of calculation and experiment |
| Classification: |
| ZB | |
|---|---|
Open Stacks  Call number: B 063207'01' Barcode: 1088103663
Available
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