Advances in imaging and electron physics. 115 / ed. by Peter W. Hawkes

Personal Name(s):	Hawkes, Peter W., editor
Imprint:	San Diego, Calif. : Academic Press, 2001
Physical Description:	XIII, 370 S.
Note:	englisch
ISBN:	9780120147571 0120147572
Series Title:	Advances in imaging and electron physics ; 115
Keywords:	modern tools for Weyl - Heisenberg frame theory logarithmic image processing developments in scanning electron microscope design Jan Bart Le Poole - pioneer of the electron microscope
Subject (ZB):	imaging technique signal processing image processing scanning electron microscopy electron microscope
Classification:	FHE - Imaging methods in materials characterization
Shelf Classification:	FHE - Bildgebende Verfahren in der Materialcharakterisierung