Microanalysis of solids / edited by B.G. Yacobi, D.B. Holt, and L.L. Kazmerski.
Saved in:
Personal Name(s): | Yacobi, B. G. |
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Holt, D. B. / Kazmerski, Lawrence L. | |
Imprint: |
New York :
Plenum Press,
1994.
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Physical Description: |
xiii, 460 p. |
Note: |
englisch |
ISBN: |
030644433X 9780306444333 |
Keywords: |
microanalysis of solids: introduction and overview microanalysis of solids: electron beam techniques scanning electron microscopy transmission electron microscopy Auger electron spectroscopy microanalysis of solids: ion beam techniques secondary ion mass spectrometry applications of MeV ion beams in materials analysis microanalysis of solids: photon beam techniques confocal optical microscopy x-ray microscopy x-ray photoemission spectroscopy laser ionization mass mectrometry microellipsometry microanalysis of solids: acoustic wave excitation scanning acoustic microscopy microanalysis of solids: tunneling of electrons and scanning probe microscopies field emission, field ion microscopy, and the atom probe scanning probe microscopy |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
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