Microanalysis of solids / edited by B.G. Yacobi, D.B. Holt, and L.L. Kazmerski.

Personal Name(s):	Yacobi, B. G.
	Holt, D. B. / Kazmerski, Lawrence L.
Imprint:	New York : Plenum Press, 1994.
Physical Description:	xiii, 460 p.
Note:	englisch
ISBN:	030644433X 9780306444333
Keywords:	microanalysis of solids: introduction and overview microanalysis of solids: electron beam techniques scanning electron microscopy transmission electron microscopy Auger electron spectroscopy microanalysis of solids: ion beam techniques secondary ion mass spectrometry applications of MeV ion beams in materials analysis microanalysis of solids: photon beam techniques confocal optical microscopy x-ray microscopy x-ray photoemission spectroscopy laser ionization mass mectrometry microellipsometry microanalysis of solids: acoustic wave excitation scanning acoustic microscopy microanalysis of solids: tunneling of electrons and scanning probe microscopies field emission, field ion microscopy, and the atom probe scanning probe microscopy
Subject (ZB):	confocal microscopy microanalysis materials characterization
Classification:	CTYR - Microanalysis FHA - Materials characterization - general aspects
Shelf Classification:	FHA - Materialcharakterisierung