Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong.

Atom probe field ion microscopy (apfim): field ion emission and surfaces and interfaces at atomic resolution :

Saved in:
Tsong, Tien Tzou.
Cambridge, New York : Cambridge University Press, 1990.
x, 387 p.
englisch
9780521363792
0521363799

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