Scanning probe microscopy : atomic scale engineering by forces and currents / Adam Foster ; Werner Hofer.

Saved in:
Foster, Adam.
Hofer, Werner.
New York, NY : Springer, 2006.
XIV, 281 S.
9780387400907
Nanoscience and technology.
Chemistry
Nanotechnology
Characterization and Evaluation Materials
Surfaces and Interfaces, Thin Films
Biological Microscopy
Atomic and Molecular Structure and Spectra
Solid State Physics and Spectroscopy
Table of Contents

IBN-3-4
Institute Call Number: B 093333'01' Barcode: 1209100056 Available