Microscopy of materials : modern imaging methods using electron, x-ray and ion beams / [by] D. K. Bowen and C. R. Hall.

Saved in:
Bowen, D. Keith.
Hall, Christopher Roxby.
London [etc.] : MacMillan, 1975.
ix, 304 p.
englisch
0333154959
9780333154953
9780333187036
0333187032
electron microscopy : microanalysis : microstructure

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