Modern methods of specimen preparation for TEM including focused ion beam (FIB) [E-Book] : proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, Krakow, Polen / / Heinz-Josef Penkalla
Penkalla, Heinz-Josef, (Verfasser)
Jülich : Forschungszentrum, Zentralbibliothek, 2003
englisch
Summer School on Advanced Electron Microscopy ; 1
JuSER
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