Modern methods of specimen preparation for TEM including focused ion beam (FIB) [E-Book] : proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, Krakow, Polen / / Heinz-Josef Penkalla
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JuSER |
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Personal Name(s): | Penkalla, Heinz-Josef, author |
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Jülich :
Forschungszentrum, Zentralbibliothek,
2003
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englisch |
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Summer School on Advanced Electron Microscopy ;
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