Modern methods of specimen preparation for TEM including focused ion beam (FIB) [E-Book] : proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, Krakow, Polen / / Heinz-Josef Penkalla
Saved in:
JuSER |
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Personal Name(s): | Penkalla, Heinz-Josef, author |
Imprint: |
Jülich :
Forschungszentrum, Zentralbibliothek,
2003
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Note: |
englisch |
Series Title: |
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Summer School on Advanced Electron Microscopy ;
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008 | r2003 eng | ||
035 | |a (Sirsi) a194110 | ||
041 | |a eng | ||
084 | 0 | |a FHGB - Conventional electron microscopy | |
100 | |a Penkalla, Heinz-Josef, |e Verfasser | ||
245 | 0 | 0 | |a Modern methods of specimen preparation for TEM including focused ion beam (FIB) |h [E-Book] : |b proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, Krakow, Polen / / |c Heinz-Josef Penkalla |
264 | |a Jülich : |b Forschungszentrum, Zentralbibliothek, |c 2003 | ||
490 | 0 | |a Summer School on Advanced Electron Microscopy ; |v 1 | |
500 | |a englisch | ||
596 | |a 1 | ||
650 | 4 | |a sample preparation | |
650 | 4 | |a transmission electron microscopy | |
856 | |u http://hdl.handle.net/2128/534 |z JuSER | ||
908 | |a Konferenz | ||
915 | |a zzwFREI | ||
949 | |a XX(194110.1) |w AUTO |c 1 |i 194110-1001 |l ELECTRONIC |m ZB |r Y |s Y |t E-BOOK |u 26/6/2009 |1 ONLINE |2 KONFERENZ |