Characterization of semiconductor materials / [by] Philip F. Kane [and] Graydon B. Larrabee.

Saved in:
Kane, Philip F.
Larrabee, Graydon B.
New York, NY : McGraw-Hill, 1970.
XVI, 351 S.
englisch
Texas Instruments electronics series.
semiconductor : physical prop,measuring method : surface prop
semiconductor : crystal growth : crystal defect

IKP
Institute Call Number: B 030431'01' Barcode: 1070004763 Available   
ZB
Reading Room Call Number: FGM 160 Barcode: 1070002806 Available