"Fundamentals of nanoscale film analysis [E-Book] / Terry L. Alford ; Leonard C. Feldman ; James W. Mayer."
Alford, Terry L.
Feldman, Leonard C. / Mayer, James W.
Boston, MA : Springer, 2007
9780387292601
Surfaces (Physics)
Nanotechnology
Particles (Nuclear physics)
Condensed matter
Electronics
Chemistry
Characterization and Evaluation of Materials
Surfaces and Interfaces, Thin Films
Nanotechnology
Solid State Physics and Spectroscopy
Condensed Matter
Electronics and Microelectronics, Instrumentation
Full Text
Description not available.