"Scanning probe microscopy [E-Book] : atomic scale engineering by forces and currents / Adam Foster ; Werner Hofer."
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Full text |
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Personal Name(s): | Foster, Adam. |
Hofer, Werner. | |
Imprint: |
New York, NY :
Springer,
2006
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ISBN: |
9780387400907 |
Series Title: |
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Nanoscience and technology.
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Keywords: |
Chemistry Nanotechnology Characterization and Evaluation Materials Surfaces and Interfaces, Thin Films Biological Microscopy Atomic and Molecular Structure and Spectra Solid State Physics and Spectroscopy |
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