EXAM : principles and practical experiments / John C. Russ ; Robert B. Shen ; Ron Jenkins.
Saved in:
Personal Name(s): | Russ, John C. |
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Shen, Robert B. / Jenkins, Ron. | |
Imprint: |
[Prairie View, IL] :
EDAX International,
1978.
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Physical Description: |
99, [3] S. |
Note: |
englisch |
Keywords: |
x ray fluorescence analysis : review |
Classification: |
ZB | |
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Open Stacks Call number: B 047564'01' Barcode: 1079001868 Available |