Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux.

Saved in:
Feldman, Leonard C.
Mayer, James W. / Picraux, S. T.
New York : Academic Press, 1982.
xix, 300 p.
Includes index
englisch
9780122526800
0122526805

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