Reliability of Microtechnology [E-Book] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.
Liu, Johan.
Salmela, Olli. / Sarkka, Jussi. / Morris, James E. / Tegehall, Per-Erik. / Andersson, Cristina.
1.
New York, NY : Springer Science+Business Media, LLC, 2011.
online resource
9781441957603
Full Text
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