Reliability of Microtechnology [E-Book] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson
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Full text |
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Personal Name(s): | Liu, Johan, author |
Salmela, Olli, author / Sarkka, Jussi, author / Morris, James E., author / Tegehall, Per-Erik, author / Andersson, Cristina, author | |
Edition: |
1. |
Imprint: |
New York, NY :
Springer Science+Business Media, LLC,
2011.
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Physical Description: |
online resource |
ISBN: |
9781441957603 |
Subject (LOC): |
Description not available. |