Lock-in thermography : basics and use for evaluating electronic devices and materials [E-Book] / O. Breitenstein ; W. Warta ; M. Langenkamp
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Full text Table of Contents |
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Personal Name(s): | Breitenstein, O. |
Warta, W. / Langenkamp, M. | |
Edition: |
2nd ed. |
Imprint: |
Heidelberg :
Springer,
2010
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Physical Description: |
X, 255 S. |
Note: |
englisch |
ISBN: |
9783642024177 |
Series Title: |
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Springer series in advanced microelectronics ;
10 |
Subject (ZB): | |
Classification: |
Description not available. |