Accuracy in trace analysis. 2 : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 / Philip D. LaFleur, editor
Saved in:
Personal Name(s): | La Fleur, Philip D., editor |
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Imprint: |
Washington :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1976
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Physical Description: |
XIII S., S. 661-1304 |
Note: |
englisch |
Series Title: |
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NBS special publication ;
422 |
Keywords: |
trace analysis : conference united states trace analysis : sampling : sample preparation : accuracy |
Classification: |
ZB | |
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Open Stacks Call number: S 001112-0422,02'01' Barcode: 1077001058 Available |