Ellipsometry : Ellipsometry: international conference 0004 : Berkeley, CA, 20.08.79-22.08.79.
Saved in:
Personal Name(s): | Muller, R. H., editor |
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Imprint: |
Amsterdam :
North Holland,
1980.
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Physical Description: |
X, 577 S. |
Note: |
englisch |
Series Title: |
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"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
Surface science ;
vol 0096. |
Keywords: |
conference united states : ellipsometry |
Subject (ZB): | |
Classification: |